Characterization of Anodic Bismuth Oxide Films

O. E. LINAREZ PÉREZ; V. C. FUERTES; M. A. PÉREZ; M. LÓPEZ TEIJELO

JOURNAL OF THE ELECTROCHEMICAL SOCIETY

Ed. J. D. Sinclair, E. Kalman, M. W. Kendig, W. Plieth, W. H. Smyrl.

Año: 2001 vol. 22 p. 99 - 99

0013-4651

n this work the anodic growth of bismuth oxide films electroformed under potenciodynamic or galvanostatic conditions as well as their stability in different formation electrolytes were studied by EIS and ellipsometric measurements. Impedance spectra indicated that anodic films consists of a nonporous barier inner layer and a porous outer layer. Ellipsometric results allowed us to obtain the optical properties and thickness of the films as well as their stability in the electrolytes.