Characterization of growth of anodic antimony oxide films by ellipsometry and XPS

OMAR E. LINAREZ PÉREZ; MIGUEL D. SÁNCHEZ; MANUEL LÓPEZ TEIJELO

JOURNAL OF ELECTROANALYTICAL CHEMISTRY

ELSEVIER

Año: 2010 vol. 645 p. 143 - 143

0022-0728

font size="4" face="AdvGulliv-R"> The processes occurring consecutively during anodic oxidation of antimony in buffered phosphate solutions are followed by in-situ ellipsometry. In the first stages of anodization, soluble species formation followed by formation of a highly hydrated film takes place. At higher potentials, the growth of a single layer of Sb2O3 anodic film occurs. Oxygen evolution occurring simultaneously with oxide growth is also detected. Surface chemical analysis by XPS allowed obtaining the chemical state and composition of the anodic antimony oxide films. The procedure followed in order to carry out the spectra deconvolution due to