An ellipsometric study of manganese oxide films. In-situ characterization of the deposition and electroreduction of MnO2

M.HERNÁNDEZ UBEDA; M.A.PÉREZ; H.T.MISHIMA; H.VILLULLAS; J.O.ZERBINO; B.A. LÓPEZ DE MISHIMA; M. LÓPEZ TEIJELO.

JOURNAL OF THE ELECTROCHEMICAL SOCIETY

The Electrochemical Society

Año: 2005 vol. 152 p. 37 - 37

0013-4651

font size="1" face="Times New Roman"> The electrodeposition of manganese oxide films onto a platinum substrate was investigated by means of in situ ellipsometry. In the thickness range from 0 to 150 nm, the anodic oxide behaves as an isotropic single layer with optical constants that are independent of thickness. Deviations at higher thickness are explained in terms of anisotropic properties of the film. The electroreduction of thin films ~up to ca. 150 nm in an alkaline electrolyte leads to a decrease in both the refractive index and the extinction coefficient and is accompanied by a thi