Characterization of growth of anodic antimony oxide films by ellipsometry and XPS

O. E. LINAREZ PÉREZ

JOURNAL OF ELECTROANALYTICAL CHEMISTRY

ELSEVIER

Lugar: Amsterdam; Año: 2010 vol. 645 p. 143 - 143

0022-0728

he processes occurring consecutively during anodic oxidation of antimony in buffered phosphate solutions are followed by in-situ ellipsometry. In the first stages of anodization, soluble species formation followed by formation of a highly hydrated film takes place. At higher potentials occurs the growth of an anisotropic Sb2O3 anodic film following a "high-field" mechanism. Oxygen evolution occurring simultaneously with oxide growth is also detected. The low values of refractive index of the anodic films are attributed to hydration and/or phosphate incorporation. Surface chemical analysis by XPS allowed obtaining the chemical state and composition of the anodic antimony oxide films. The procedure followed in order to carry out the spectra deconvolution due to overlapping of O1s and Sb3d photoemission lines is discussed. The binding energy values obtained for O1s and Sb3d signals as well as the O/Sb atomic ratio indicates hat the anodic film formed at low or high potentials is composed