Effect of thermal noise on the current-voltage characteristics of Josephson Junctions

A.K. CHATTAH; C.B. BRIOZZO; O. OSENDA; M.O. CÁCERES

INTERNATIONAL JOURNAL OF MODERN PHYSICS B

World Scientific Publishing Company

Año: 1996 vol. 10 p. 1095 - 1095

0217-9792

e analyze the influence of thermal noise on the Shapiro steps appearing in the current-voltage characteristics of Josephson junctions. We solve the Fokker-Planck equation describing the system by a path integral method in the steepest-descent approximation. We obtain the asymptotic time periodic distribution and compute from it the voltage, constructing the I-V characteristics. We find a defined softening of the Sapiro steps as temperature increases, for values of the system parameters in the experimental accesible range.